Title: Thermal Control Units for IC Testing | Characterization | Validation | Reliability | FA | ATE | Production | IC Test | Temperat
Description: A global leader in temperature control solutions that are used primarily by semiconductor manufacturers to test their IC and wafer. A better choice in thermal-forcing technology for IC Testing, Characterization, Validation, Reliability, FA, ATE and Produ
Keywords:
IC test,
IC temperature control,
wafer test,
temperature forcing,
thermal testing,
temperature testing,
thermal cycling,
benchtop thermal test,
thermal forcing,
Temperature Testing Semiconductor IC Devices,
conduction,
direct contact,
Test Chambers